ToF-SIMS
Innovia Films has taken delivery of a custom built time of flight secondary ion mass spectrometer (ToF-SIMS), custom built by Kore Technologies.This equipment allows Innovia Films to characterise surfaces by obtaining chemical information about the top few layers of the sample. Characteristic mass fragments of the surface are obtained from one to a theoretically limitless high mass range. (Figure 1).
Figure 1: An Example of Some of the Chemical Information available from the ToF-SIMS.
The picture at the top of the page shows the Viewing Chamber and Associated Hardware for Innovia Films' ToF-SIMS.
The ToF-SIMS has already proved extremely valuable for failure analysis and is assisting in surface engineering for new product development and innovation, some of Inovia Films core competencies.
